Jeol 6700f sem user manual

The jsm7900f is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including. Operating procedure for jeol 7600f high resolution. Jeol jsm 6460 scanning electron microscope sem with oxford inca energy eds system and mics microscope image capture system is a highperformance versatile sem. A stage graphic simplifies the search for target sites when the stage navigation system option is used, it is possible to locate a region of interest with the feel of operating an optical microscope. Jsm7500f field emission scanning electron microscope. On tem spot1, alpha3 xyz0, tx0, ty0 double click stage neutral to return all coordinates to 0 beam valve. Login proceeds automatically, displaying the epma main menu on the monitor. Rotate the power key switch to the start position, and release the hand from the key. Set the specimen on the specimen support, and adjust the specimen support so that the top. The information contained in this manual is subject to change without notice. Click the button and read the penning gauge to ensure that the microscope is at appropriate vacuum 104 105 pa.

With a pin or any sharp object, carefully open the clamp 5 of the specimen holder and insert the grid with the sample. Standard operating procedure for the jeol jsm840a sem. If the sem software is not running, start sem software sem main menu icon. The jsm6700f is able to handle samples up to 8 inches in diameter. Pumps running and evac light green main panel near key switch. Shutdown click beam current off leave magnification at 5000 use specimen position monitor to position holder in center remove holder using proper procedure log out of tem computer camera computer. Under the initialize menu in the epma main menu, select logout. The specimen exchange procedure is presented in a flow format, so that the process can be easily completed even by a first time user.

This manual should be considered a work in progress. Insert the specimen exchange rod and turn the knob to the left. Jsm7600f schottky field emission scanning electron microscope. Once training begins, you may request access to the room from gang liang.

The jsm7900f is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously. Verify the vacuum in jeol pc temcon valve status window vacuum system guncamera valves v1 and v2 off black pirani gauge status pig2 wanted. Select a user name from the user list, and click the. This is a very minimal operation checklist and does not replace the other reference manuals. Use keyboard and mouse lying on top of gatan computer to log into that computer. Click yes if message on screen about stage appears. The jsm7900f field emission sem is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. Like a true generalpurpose sem system, jsm7500f can provide highresolution imaging of large specimens gentle beam gb provides topsurface imaging with ultralow energy incident electrons a gentle beam gb mode with better resolution than the normal mode is available.

Its also suitable for high spatial resolution analysis. Jeol innovations in resolution and functionality enable the microscopist to better image. This manual contains information regarding the basic operation of this microscope for conventional imaging. Turn on the scanning image observation instrument with the ope power switch at the rear of the instrument. The jed2300, eds developed by jeol, is embedded in the compact sems. Jeol provides valuable applications support, comprehensive training, and awardwinning service for the long lifetime of our instruments. With time, we will add sections as operating procedures are developed or improved by user experience. Jeol ltd jsm6700f scanning electron microscope sold lot. Jeol has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s.

The highprecision electron optical system incorporated in this sem is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter specimen. This tool excels in lightning fast data acquisition through simple and automated operation. User guide jeol jsm6300 scanning electron microscope compiled by sam boggs, with input from john donovan, ricky gasser, and ben klusman 1. These are the only procedures you should carry out, unless you have received specific additional training. Log in to your session on the computer to the left of the microscope. If you leave files, they will be deleted after a month. Open the program and log in with your user name and password. Sem jsm7600f quick operating instruction manual important be careful not to let the air inside the chamber when inserting the sample using the exchange rod turbo pump can be damaged. If your specimen needs to protrude above the cylinders top face or the top face of another holder, you can. The jsm5600 is a conventional sem with a tungsten filament electron source. Open the gun isolation valve by clicking the on button under observation. Scanning electron microscope 6 pages summary of contents for jeol jem2100f page 1 instructions jem2100f field emission electron microscope for the proper use of the instrument, be sure to read this instruction manual. Obtaining an image 1 wait until the chamber vacuum is at 5x10 4 pa or lower.

It is equipped with a secondary electron detector for topographic contrast imaging and an oxford inca edx system for compositional analysis. If you are the first user of the day, take out acd heater, fill the anticontamination device acd with ln. It is a topoftheline sem for semiconductors, nanotechnology, material science. Jeol jsm6060lv operating instructions manual pdf download. The graphic user interface figure 4 the jeol 2500se gui. Oxford instruments inca tips some useful tips when using the oxford inca system. Use the standard procedure for sample preparation and put the sample into the holder. Follow the procedures below when you use the jem1400plus. The jeol jsm7610fplus field emission sem combines two proven technologies. Jeol jsm6060lv scanning electron microscope is userfriendly and easy to operate. The sem and eds are operated as one seamless system to provide comfortable and efficient operation. The system can be operated in variable pressure mode air to reduce charging or image nonconductive specimens. Jcm6000plus is a fullfledged benchtop sem with versatile functions. Jeol 6700f sem that has capabilities for energy dispersive spectroscopy eds to perform elemental analysis.

Jeol 7000 fe scanning electron microscope ua analytical. Select ok, wait for the login screen and then enter your code and password. Check sem status under the maintenance gunvac gun and write down the sip1pa and sip2 pa pressure on your log in sheet. Sem jsm 5800 quick operating instruction manual starting position control unit. Basic knowledge for using the sem since the scanning electron microscope sem was first commercialized about 40 years ago, the sem has shown a remarkable progress. When the electron beam is turned on, some xrays are. The jsm 6700f is a high resolution sem with a field emission gun feg electron source.

The jsm6700f is a high resolution sem with a field emission gun feg electron source. Scanning electron microscope materials characterization and. Jeol jem 2010 training transmission electron microscope user manual version 5. Withdraw the specimen exchange rod all the way out. Sem jeol, jsm6301 operation manual 2014 06 11 the turning. If vacuum is not good enough, contact somebody from the lme staff.

Press ctrlaltdel and log on to the microscope computer. The jsm 6700f is able to handle samples up to 8 inches in diameter. The jeol jsm6010 is a tungsten cathode scanning electron microscope equipped with secondary, backscattered and secondary electron detectors, cathode luminescence and edx detector. Operation via touch panel simplifies execution from observation to analysis. Standard operating procedure for the jeol jsm840a sem the nebraska center for materials and nanoscience central facility for electron microscopy 12c walter scott engineering center university of nebraska lincoln, nebraska this work is intended a guide to the operation of the jsm840a sem by the average user. Jeol 1200ex instructions analytical imaging facility. It is equipped with a secondary electron detector for topographic contrast imaging, a retractable backscattered electron detector for atomic number contrast imaging and an oxford inca edx system for compositional analysis. Jeol is a world leader in electron optical equipment and instrumentation for highend scientific and industrial research and development. Burn your files onto a provided cd, delete your files. The jsm6700f is a super intelligent pc sem assuring compatibility with future computer technologies. Basic sem unit the jsm6300 basic unit fig 1 consists of an electron optical column mounted on the main console, a control and display system, a power supply unit, and a pump box.

Jsm7610f is an ultra high resolution schottky field emission scanning electron microscope which has semiinlens objective lens. We will have to use some of your beam time 510 mins. After this, the computers should be controllable by jeol mouse and keyboard. Safety the scanning electron microscope is a relatively safe instrument you can do much more damage to it than it can do to you. This manual was written for all three us geological survey microprobe laboratories and is intended to be an overall user s guide to the operation of a jeol 8900 series superprobe. Jeol usa scanning electron microscopes sem jeol usa inc. Jeol jsm 6460 scanning electron microscope sem jeol jsm. Lab facilities and training scanning electron microscope.

Scanning electron microscope this is a cold field emitter high resolution sem model. Scanning electron microscope materials characterization. High power optics can provide high throughput and high performance analysis. Here you can find nuclear magnetic resonance tutorials to suit you need. Intuitive operation is achieved via touch panel and new operation screens. S c a n n i n g introduction he jeol jsm6060lv is a stateoftheart scanning electron microscope that features a low vacuum for observation of nonconductive specimens, a fully automated electron gun, a backscattered electron detector for atomic number contrast imaging, fully integrated digital control, motorized xy stage, and a noran system. The highprecision electron optical system incorporated in this sem is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter speci. Verify the vacuum in jeol pc temcon valve status window vacuum system guncamera valves v1 and v2 off black pirani gauge status pig2 user or gang lianggang. If not logged in, log in to the user accounts on the jeol and gatan computers. Jeol 6700 user manual 3392018 log in to your session on the computer to the right of the microscope. Operating procedure for jeol 7600f high resolution analytical sem. Jeol 7600f high resolution analytical sem operating procedure v. The low vacuum mode is included in the standard configuration, and eds can be installed, offering a truly multifunctional benchtop sem.

April 8, 2020 by jeol usa scanning electron microscope sem 0 comment read more scanning electron microscope a to z. Move lens power supply switch to on and accelerating voltageswitch to operate. Its unique graphical user interface controls condition setup, motor stage drive, imaging, and data filing, assuring stable and reliable operation. Sem jeol, jsm6301 operation manual 2014 06 11 the turning on the sem 1. Basic operation ppt exploring the jeol program ppt intro to oxford edx ppt oxford channel 5 user manual pdf related links.

This manual was written for all three us geological survey microprobe laboratories and is intended to be an overall users guide to the operation of a jeol 8900 series superprobe. Follow the procedures below when you use the jem1400plus tem. This document is an introduction to the operation of the jeol 5800lv scanning electron microscope and the oxford isis 300 analytical system. If the previous user has left the probe in an overnight run, you will need to enter your password to activate the screen. Jc m 6 0 p l u s n e o s c o p e b e n c h t o p s e m jcm6000plus. Jem 2100 manual operation and basic alignment instructions 1. Builtin rfilter enabling user selectable mixture of secondary electron and. The jsm 6700f is a super intelligent pc sem assuring compatibility with future computer technologies. Check sem status under the maintenance gunvac gun and write down the. Stylish appearance, compact and lightweight allows for installation in small spaces. Basic stepbystep instructions for jeol 6060lv version 411 general operation 1. Explore our range of intouchscope sems, field emission sems, multibeam fib sems, and our benchtop sem.